Field-Ion Microscope for Characterization of Tunneling Tips
![Feldionenmikroskop zur Charakterisierung von Tunnelspitzen (AG Schirmeisen)](https://www.uni-giessen.de/de/fbz/zentren/lama/Platt/geraete/bilder_geraete/feldionenmikroskop-foto01/@@images/image-400-1a214f4a91f654226d184380e62e4a96.jpeg)
Platform:
Location:
Physics Building, Heinrich-Buff-Ring 16, room 017
Type, properties, other information:
(no description available)
Person in Charge:
Dr. Daniel Ebeling
Institute of Applied Physics
Physics Building, Heinrich-Buff-Ring 16, room 218
Phone +49-641-99-33482