Atomic Force Microscope (AFM) with High Vacuum
![Hochvakuum-AFM (AG Schlettwein)](https://www.uni-giessen.de/de/fbz/zentren/lama/Platt/geraete/bilder_geraete/hochvak-afm-foto01/@@images/image-400-1a214f4a91f654226d184380e62e4a96.jpeg)
Platform:
Scanning Probe Methods (Sonde)
Location:
Physics Building, Heinrich-Buff-Ring 14, room 43 (ground floor)
Type, properties, other information:
for measurements under high vacuum typical for KPFM (Kelvin probe force microscopy), if necessary after sample transfer without vacuum interruption (type Vacuscope 1000 from AIST-NT)
Person in Charge:
Prof. Dr. Derck Schlettwein
Institute of Applied Physics
Physics building, Heinrich-Buff-Ring 16, Room 139
Phone +49-641-99-33401